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Program

Thursday May 31st – June 1st, 2018 | Bremen, Germany

 Thursday, May 31st, 2018

  • 16:30-16:40 Opening
  • 16:40-18:00 Invited Speaker:
    A New DfT Standard on the Horizon: IEEE Std P1838 for 3D Test Access
    Erik Jan Marinissen, IMEC, TU-Eindhoven, Teresa McLaurin, ARM

Friday, June 1st, 2018

  • 08:30-09:30 Keynote:
    Watch the Back Door: Security Issues in Test
    Jennifer Dworak, Southern Methodist University
  • 09:30-10:30 SURREALIST-Panel:
    Safety: Riccardo Mariani, Intel
    Trust: Georg Becker, ESMT Berlin
    Privacy: Eugenio Villar Bonet, Universidad de Cantabria
    Security: Benedikt Gierlichs, KU Leuven
    Reliability: H.J. Wunderlich, U. Stuttgart
    Test: Yervant Zorian, Synopsys

  • 10:30-11:00 Coffee Break

  • 11:00-12:30 Regular Session 1:
    In-Field Utilization of the IEEE 1687 Standard
    Ahmed Ibrahim and Hans Kerkhoff, Univ. Twente
    Concurrent IJTAG
    René Krenz-Baath, Hamm-Lippstadt Univ.
    Comparing different approaches to the test of IEEE 1687 reconfigurable scan networks
    Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda and Giovanni Squillero, Politecnico di Torino

  • 12:30-13:30 Lunch Break

  • 13:30-15:00 Embedded Tutorials:
    In-Field IEEE1687-based Health Monitoring and Fault Management for Self-Health-Aware SoCs
    Konstantin Shibin, Artur Jutman, Testonica
    1687.1-Update
    Jeff Rearick, AMD

  • 15:00-15:30 Coffee Break

  • 15:30-16:30 Regular Session 2:
    An Example IEEE P1687.1-like Solution
    Martin Keim, Mentor Graphics
    PDL Extension for ITC'2016 IEEE 1687 Benchmark Networks and Ecosystem
    Anton Tsertov, Artur Jutman and Sergei Devadz, Testonica

  • 16:30-16:40 Closing

© 2020 Hamm-Lippstadt University of Applied Sciences

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