PROGRAM

Thursday May 31st – June 1st, 2018 | Bremen, Germany

16:30-16:40 Opening
16:40-18:00 Invited Speaker:
A New DfT Standard on the Horizon: IEEE Std P1838 for 3D Test Access
Erik Jan Marinissen, IMEC, TU-Eindhoven, Teresa McLaurin, ARM

08:30-09:30 Keynote:
Watch the Back Door: Security Issues in Test
Jennifer Dworak, Southern Methodist University
09:30-10:30 SURREALIST-Panel:
Safety: Riccardo Mariani, Intel
Trust: Georg Becker, ESMT Berlin
Privacy: Eugenio Villar Bonet, Universidad de Cantabria
Security: Benedikt Gierlichs, KU Leuven
Reliability: H.J. Wunderlich, U. Stuttgart
Test: Yervant Zorian, Synopsys
10:30-11:00 Coffee Break
11:00-12:30 Regular Session 1:
In-Field Utilization of the IEEE 1687 Standard
Ahmed Ibrahim and Hans Kerkhoff, Univ. Twente
Concurrent IJTAG
René Krenz-Baath, Hamm-Lippstadt Univ.
Comparing different approaches to the test of IEEE 1687 reconfigurable scan networks
Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda and Giovanni Squillero, Politecnico di Torino
12:30-13:30 Lunch Break
13:30-15:00 Embedded Tutorials:
In-Field IEEE1687-based Health Monitoring and Fault Management for Self-Health-Aware SoCs
Konstantin Shibin, Artur Jutman, Testonica
1687.1-Update
Jeff Rearick, AMD
15:00-15:30 Coffee Break
15:30-16:30 Regular Session 2:
An Example IEEE P1687.1-like Solution
Martin Keim, Mentor Graphics
PDL Extension for ITC'2016 IEEE 1687 Benchmark Networks and Ecosystem
Anton Tsertov, Artur Jutman and Sergei Devadz, Testonica
16:30-16:40 Closing

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